COMPLEX SYSTEM TEST STRATEGY
This work, in association with Des Farren at Digital Equipment Corp., has made great steps towards the understanding of the complexities of high level test for complex systems.
Essentially, this work began with the analysis of field failures in order to categorise the classes of failure, determined which ones could be addressed through improved manufacturing test, created complex economic models to detemine the cost-benefit of each proposed new test strategy, and then implemented those that were considered worthwhile.
The initial results of this have been extremely promising. leading to the financial savings of approx. 30% whilst also improving product quality.
Further details can be elicited from the papers below, available in PostScript format.
"System Test Cost Modelling Based on Event Rate Analysis"
"Cost-Effective System-Level Test Strategies"
"System-Level Test: Characterisation and Improvement"
Tony Ambler
Department of Electrical and Computer Engineering
University of Texas at Austin
Engineering Science Building 513
Austin, TX 78712-1084
Tel: (512) 475 6153
Fax: (512) 471 1084
If you have any comments, suggestions or enquiries, please mail me at:
