Nur A. Touba - Biography
Nur Touba was born and raised in suburban Minneapolis. He did his
undergraduate work at the University of Minnesota where he graduated
Summa Cum Laude. He received a graduate fellowship at Stanford
University. At Stanford, he worked with Prof. Edward McCluskey at the
Center for Reliable Computing. He completed his Ph.D. in 1996. He
received a National Science Foundation (NSF) Early Faculty CAREER
Award in 1997, College of Engineering Foundation Faculty Award in
2001, Best Paper Award at the VLSI Test Symposium in 2001, Best Panel
Award at the International Test Conference in 2005, General Motors
Faculty Fellowship in 2006, Best Paper Award at the International
Symposium on Defect and Fault Tolerance in 2008, and IEEE Fellow in 2009.
Dr. Touba's research interests are in VLSI testing and fault-tolerant
computing. He has developed a number of innovative techniques for
automated design of testable and fault-tolerant circuits. In
particular, his research has focused on developing new techniques for
test data compression, built-in self-test (BIST), delay fault testing,
concurrent error detection, and design-for-testability (DFT) in
core-based designs.
Dr. Touba is on the program committee for the International Test
Conference (ITC), International Conference on Computer Design (ICCD),
Design Automation and Test in Europe Conference (DATE), International
On-Line Test Symposium (IOLTS), European Test Symposium (ETS), Asian
Test Symposium (ATS), Defect and Fault Tolerance Symposium (DFTS),
International Test Synthesis Workshop (ITSW), Latin American Test
Workshop (LATW), Microprocessor Test and Verification Workshop (MTV),
International Workshop on Open Source Test Technology Tools (IOST3),
ATE Vision 2020 Workshop, International Workshop on Impact of
Low-Power Design on Test and Reliability, Workshop on RTL and High
Level Testing, and International Conference
on Advances in System Testing and Validation Lifecycle (VALID). He is
on the editorial board of the Journal of Low Power Electronics (JOLPE)
and the Journal of Electronic Testing: Theory and Applications. He
has served as Program Chair for the 2008 International Test Conference,
2008 International Test Synthesis Workshop, and 2006 Defect and Fault
Tolerance Symposium.
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