Lecture:
Instructor: Nur Touba
Unique No.: 14960

Prerequisite: Basic logic design course

Area: Integrated Circuits and Systems (ICS)

Textbook: VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) (ISBN: 0-1237-0597-5)

Description:
This course covers VLSI testing and design-for-testability. The following topics are covered:

Fault Models - Stuck-at, Bridging, Delay, etc.
Test Pattern Generation - ATPG algorithms and issues, Psuedo-exhaustive test, Functional testing
Design-for-Testability - Ad-hoc, Scan, Boundary Scan
Built-in Self-Test (BIST) - Techniques and architectures
Diagnosis - Techniques and algorithms
System-on-a-Chip (SOC) Testing - Techniques for core based designs

The course focuses on both current industrial practice as well as cutting edge research in VLSI testing. There are two design projects.